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High-throughput structure/function screening of materials and catalysts with multiple spectroscopic techniques

By Moniek Tromp, Sergio Russu, Andy J. Dent, Fred W. Mosselmans, Ian Harvey, Shu Hayama, Andrea E. Russell, Sam Guerin, Brian E. Hayden, Jens-Peter Suchsland, Ken Meacham, Michael Surridge, Jeremy G. Frey, Nikolaos Tsapatsaris, Angela M. Beesley, Sven L.M. Schroeder, Mark A. Newton, Steven Fiddy, Olga V. Safonova, Pieter Glatzel, Norman Binsted and John Evans

Abstract

High throughput screening methodologies are expanded to synchrotron based x-ray absorption techniques. An environmental chamber, based on ultra-high vacuum equipment, has been developed allowing in situ studies on arrays of samples while X-ray absorption fine structure spectroscopy, Raman spectroscopy, mass spectrometry and/or Xray diffraction can be applied simultaneously to characterize the system under process conditions in a time-resolved manner. The chamber accommodates a diverse range of samples from surface science to materials chemistry to heterogeneous catalysis. Data acquisition and data logging software is developed to handle large quantities of divers but related information. New data logging, processing and analysis procedures and programs are developed which will allow fast structure-function relationships characterization

Topics: QD, QC
Year: 2007
OAI identifier: oai:eprints.soton.ac.uk:47110
Provided by: e-Prints Soton
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