Article thumbnail

Modeling of Noise-Temperature Measurements in Submicrometer Semiconductor Structures

By V. Gružinskis, E. Starikov, P. Shiktorov, L. Reggiani and L. Varani


International audienc

Topics: [PHYS.COND]Physics [physics]/Condensed Matter [cond-mat], [PHYS.PHYS.PHYS-COMP-PH]Physics [physics]/Physics [physics]/Computational Physics [physics.comp-ph], [SPI.TRON]Engineering Sciences [physics]/Electronics
Publisher: World Scientific
Year: 1995
DOI identifier: 10.1142/2764
OAI identifier: oai:HAL:hal-02433810v1
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • https://hal.archives-ouvertes.... (external link)
  • Suggested articles

    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.