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Cryogenic instrumentation for fast current measurement in a silicon single electron transistor

By T. Ferrus, D. G. Hasko, Q. R. Morrissey, S. R. Burge, E. J. Freeman, M. J. French, A. Lam, L. Creswell, R. J. Collier, D. A. Williams and G. A. D. Briggs
Publisher: AIP Publishing
Year: 2009
DOI identifier: 10.1063/1.3191671
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Provided by: MUCC (Crossref)
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