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On recent developments for high-speed atomic force microscopy

By Georg Schitter, Georg E. Fantner, Johannes H. Kindt, Philipp J. Thurner and Paul K. Hansma


The atomic force microscope (AFM) is limited in imaging speed by the bandwidth and dynamic behavior of the actuators and mechanical parts. For high-speed imaging all AFM components have to be optimized in performance. Here, we present improvements of the force sensor, the scanner, the controller, and the data acquisition system. By combining all these improvements, the next generation AFMs will enable imaging speeds more than two orders of magnitude faster than current commercial AFM systems

Topics: TK, QC
Publisher: Institute of Electrical and Electronics Engineers
Year: 2005
OAI identifier: oai:eprints.soton.ac.uk:49205
Provided by: e-Prints Soton
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