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High-resolution soft x-ray spectrometry using the electron-multiplying charge-coupled device (EM-CCD)

By David J. Hall, James H. Tutt, Matthew R. Soman, Andrew D. Holland, Neil J. Murray, Bernd Schmitt and Thorsten Schmitt
Publisher: SPIE
Year: 2013
DOI identifier: 10.1117/12.2024010
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Provided by: MUCC (Crossref)
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