Article thumbnail

High-resolution soft x-ray spectrometry using the electron-multiplying charge-coupled device (EM-CCD)

By David J. Hall, James H. Tutt, Matthew R. Soman, Andrew D. Holland, Neil J. Murray, Bernd Schmitt and Thorsten Schmitt
Publisher: SPIE
Year: 2013
DOI identifier: 10.1117/12.2024010
OAI identifier:
Provided by: MUCC (Crossref)
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • http://oro.open.ac.uk/39009/1/... (external link)
  • Suggested articles


    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.