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Direct measurement of the complex refractive index in the extreme ultraviolet spectral region using diffraction from a nanosphere array

By B. Mills, C.F. Chau, E.T.F. Rogers, J. Grant-Jacob, S.L. Stebbings, M. Praeger, A.M. de Paula, C.A. Froud, T.J. Butcher, J.J. Baumberg, W.S. Brocklesby and J.G. Frey


Using extreme ultraviolet (XUV) radiation from a high harmonic source, we observe diffraction from a single-layer self-assembled hexagonal array of 196 ±1.2 nm diameter polystyrene spheres. The Mie solution is used to predict the correct form factor for a single sphere and hence model the intensities of the observed diffraction peaks for the first three orders. By measuring the diffraction intensities in this way, we demonstrate a technique for obtaining the complex refractive index of a material at multiple wavelengths in the XUV from a single measurement. We present experimental results for polystyrene in the range of 25-30 nm

Topics: QC, TK
Year: 2008
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Provided by: e-Prints Soton

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