Article thumbnail

Tensile fracture of integrated single-crystal silicon nanowire using MEMS electrostatic testing device

By Toshiyuki Tsuchiya, Tetsuya Hemmi, Jun-ya Suzuki, Yoshikazu Hirai and Osamu Tabata
Publisher: Elsevier BV
Year: 2016
DOI identifier: 10.1016/j.prostr.2016.06.178
OAI identifier:
Provided by: MUCC (Crossref)
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • https://doi.org/10.1016/j.pros... (external link)
  • Suggested articles


    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.