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A Comprehensive Study on the Avalanche Breakdown Robustness of Silicon Carbide Power MOSFETs

By Asad Fayyaz, Gianpaolo Romano, Jesus Urresti, Michele Riccio, Alberto Castellazzi, Andrea Irace and Nick Wright
Publisher: MDPI AG
Year: 2017
DOI identifier: 10.3390/en10040452
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Provided by: MUCC (Crossref)
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