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Electromigration-Induced Bi Segregation in Eutectic SnBi Solder Joint

By Chih-Ming Chen, Long-Tai Chen and Ya-Shiu Lin
Publisher: Springer Science and Business Media LLC
Year: 2007
DOI identifier: 10.1007/s11664-006-0025-0
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Provided by: MUCC (Crossref)
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