Article thumbnail

Nanometer-scale material contrast imaging with a near-field microwave microscope

By Atif Imtiaz, Steven M. Anlage, John D. Barry and John Melngailis
Publisher: AIP Publishing
Year: 2007
DOI identifier: 10.1063/1.2719164
OAI identifier:
Provided by: MUCC (Crossref)
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • (external link)

  • To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.

    Suggested articles