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Application of optical reflectivity measurements to diagnostics for plasma facing materials

By M. Miyamoto, M. Yamamoto, T. Akiyama, N. Yoshida, M. Tokitani and A. Sagara
Publisher: Elsevier BV
Year: 2016
DOI identifier: 10.1016/j.nme.2016.08.012
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Provided by: MUCC (Crossref)
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