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Simultaneous measurement of temperature, stress, and electric field in GaN HEMTs with micro-Raman spectroscopy

By Kevin R. Bagnall, Elizabeth A. Moore, Stefan C. Badescu, Lenan Zhang and Evelyn N. Wang
Publisher: AIP Publishing
Year: 2017
DOI identifier: 10.1063/1.5010225
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Provided by: MUCC (Crossref)
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