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High resolution x-ray characterization of periodically domain-inverted nonlinear optical crystals

By Z.W. Hu, P.A. Thomas and J. Webjörn

Abstract

A high-resolution triple-axis diffractometer has been used for the structural characterization of periodically domain-inverted nonlinear optical crystals of KTiOPO4 and LNbO3. Striations have been revealed in high strain-sensitivity multiple-crystal topographs of the domain-inverted regions of both these samples and these are dominated by orientation contrast. The combination of high-resolution reciprocal-space mapping and topography has shown that the extended diffraction streak in the q[210] direction for domain-inverted LiNbO3 originates from the "minutely misoriented structure" which is related to the original configuration of dislocations. The reason for the generation of the structural imperfections via the domain-inversion processing is interpreted in terms of the converse piezoelectric effect

Topics: QC, TK
Year: 1995
OAI identifier: oai:eprints.soton.ac.uk:78171
Provided by: e-Prints Soton

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