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In vacuo measurement of the sensitivity limit of planar Bragg sensors

By R.M. Parker, J.C. Gates, N.P. Sessions, D.O. Kundys, C.B.E. Gawith, M.C. Grossel and P.G.R. Smith

Abstract

We present the direct measurement and modeling of the sensitivity limit of an integrated refractive index sensor for the detection of molecular monolayers. Direct UV writing can be used to fabricate a wide range of integrated optical devices particularly Bragg gratings. These Bragg gratings are inherently sensitive to temperature and strain

Topics: QC, TK
Year: 2009
OAI identifier: oai:eprints.soton.ac.uk:78998
Provided by: e-Prints Soton

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Citations

  1. (2005). First order phase change detection using planar waveguide Bragg grating refractometer”, doi
  2. (1999). Sensitivity enhancement of integrated optical sensors by use of thin high-index films”, doi

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