Skip to main content
Article thumbnail
Location of Repository

In vacuo measurement of the sensitivity limit of planar Bragg sensors

By R.M. Parker, J.C. Gates, N.P. Sessions, D.O. Kundys, C.B.E. Gawith, M.C. Grossel and P.G.R. Smith


We present the direct measurement and modeling of the sensitivity limit of an integrated refractive index sensor for the detection of molecular monolayers. Direct UV writing can be used to fabricate a wide range of integrated optical devices particularly Bragg gratings. These Bragg gratings are inherently sensitive to temperature and strain

Topics: QC, TK
Year: 2009
OAI identifier:
Provided by: e-Prints Soton

Suggested articles


  1. (2005). First order phase change detection using planar waveguide Bragg grating refractometer”, doi
  2. (1999). Sensitivity enhancement of integrated optical sensors by use of thin high-index films”, doi

To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.