Article thumbnail

Continuum theory of memory effect in crack patterns of drying pastes

By Ooshida Takeshi
Publisher: American Physical Society (APS)
Year: 2008
DOI identifier: 10.1103/physreve.77.061501
OAI identifier:
Provided by: MUCC (Crossref)
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • http://arxiv.org/pdf/0804.0966 (external link)
  • Suggested articles


    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.