Skip to main content
Article thumbnail
Location of Repository

Optimal Design of Failure Step Stress Partially Accelerated Life Tests with Type II Censored Inverted Weibull Data

By Amal S. Hassan and Abeer K. Al-thobety

Abstract

This article provides the optimum simple failure step stress partially accelerated life tests (FSS-PALTs) and statistical inferences for the model parameters and acceleration factor in which items are run at both accelerated and use conditions. It is assumed that the lifetime of the test items follows inverse Weibull distribution under type II censoring. The maximum likelihood estimators (MLEs), asymptomatic variance-covariance matrix, and the confidence bounds of the model parameters and acceleration factor are obtained via MathCAD"14". The optimum test a plan specifies the optimal stress switching point is determined by minimizes the generalized asymptotic variance of the MLEs for the model parameters. Finally, the numerical studies are applied to illustrate the proposed procedures

Topics: Generalized asymptotic variance, Inverse Weibull
Year: 2014
OAI identifier: oai:CiteSeerX.psu:10.1.1.416.450
Provided by: CiteSeerX
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • http://citeseerx.ist.psu.edu/v... (external link)
  • http://www.ijera.com/papers/Vo... (external link)
  • Suggested articles


    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.