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Copper – Oxides of Hafnium-silicon

By Hyun Jung Park, John M. White, Dim Lee Kwong, Llewellyn K. Rabenberg and Russell D. Dupuis

Abstract

Certifies that this is the approved version of the following dissertation: Interfacial properties of thin film hetero-structure

Year: 2014
OAI identifier: oai:CiteSeerX.psu:10.1.1.410.1287
Provided by: CiteSeerX
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