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Concurrent Efficient Evaluation of Small-Change Parameters and Green's Functions for TCAD Device Noise and Variability Analysis

By Simona DONATI GUERRIERI, Marco Pirola and Fabrizio Bonani

Abstract

We present here an efficient numerical approach for the concurrent evaluation of the small-change deterministic device parameters and of the relevant Green’s functions exploited in the simulation of device small-signal (SS), small-signal large-signal (SSLS conversion matrix), stationary and cyclostationary noise, and variability properties of semiconductor devices through the solution of physics-based models based on a partial-differential equation description of charged carrier transport. The proposed technique guarantees a significant advantage in computation time with respect to the currently implemented solutions. The accuracy is the same as for the standard technique

Topics: Conversion matrix, noise, numerical simulations, semiconductor device modeling, small-signal parameters, variability
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Year: 2017
DOI identifier: 10.1109/TED.2017.2651168
OAI identifier: oai:iris.polito.it:11583/2665944
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