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1 2 3 Characterization of Fault Roughness at Various Scales: Implications of Three-Dimensional High Resolution Topography Measurements 4 5 6

By Thibault C, François Renard, Michel Bouchon, David Marsan and Christophe Voisin

Abstract

35 36 37 38 39 4

Year: 2013
OAI identifier: oai:CiteSeerX.psu:10.1.1.371.1344
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