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Electrically Induced Damage to Standard Linear Integrated Circuits: The Most Common Causes and the Associated Fixes to Prevent Reoccurrence," Analog Devices AN-397

By Niall Lyne

Abstract

The sensitivity of electronic components to transient electrical overstress events is a well-known problem, exacerbated by the continuing evolution of integrated circuits. Smaller geometries, increased circuit densities

Year: 2013
OAI identifier: oai:CiteSeerX.psu:10.1.1.353.3110
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