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Santiago de Querétaro,

By D. Richard Kuhn, Itzel Dominguez Mendoza, Raghu N. Kacker, Yu Lei and Centro Nacional De Metrologia

Abstract

Abstract—Empirical data demonstrate the value of t-way coverage, but in some testing situations, it is not practical to use covering arrays. However any set of tests covers at least some proportion of t-way combinations. This paper describes a variety of measures of combinatorial coverage that can be used in evaluating aspects of t-way coverage of a test suite. We also provide lower bounds on t-way coverage of several widely-used testing strategies, and describe a tool that analyzes test suites using the measures discussed in the paper. Keywords-component; combinatorial testing; factor covering array; state-space coverage; verification and validation (V&V); t-way testing; configuration model; t-way testing; I

Year: 2013
OAI identifier: oai:CiteSeerX.psu:10.1.1.352.8377
Provided by: CiteSeerX
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