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analysis · Rejection criterion · Recognition reliability

By Chun Lei, He Louisa, Lam Ching, Y. Suen, L. Lam and C. Y. Suen

Abstract

measurement based on linear discriminant analysis

Publisher: 2013-09-23
Year: 2013
OAI identifier: oai:CiteSeerX.psu:10.1.1.352.7504
Provided by: CiteSeerX
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