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New routing and compaction strategies for yield enhancement

By Venkat K. R. Chiluvuri and Israel Koren


Improvements in manufacturing lines alone can not compensate for the yield losses due to the increase in complezity of logic. Manufacturing yield improvement needs to be addressed during the physical layout synthesis stage itself. Several layout strategies for yield enhancement are proposed and they are illustrated with respect to channel compaction and routing in standard cell design. Algorithms and other implementation issues are discussed and ezamples illustrating these algorithms are presented.

Publisher: Plenum
Year: 1992
OAI identifier: oai:CiteSeerX.psu:
Provided by: CiteSeerX
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