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Reliability, factor structure and validity of the Dutch Eysenck Personality Profiler

By P.E.H.M. Muris, H.G. Schmidt, H.L.G.J. Merckelbach and E.G.C. Rassin
Year: 2000
DOI identifier: 10.1016/S0191-8869(99)00237-8
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Provided by: UM Publications

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