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A Dynamic Diagnostic Test Generation System for I_DDQ Measurement Based Diagnosis of Bridging FAults

By Yiming Gong and Sreejit Chakravarty


A paradigm for diagnosis, known as dynamic diagnosis, is defined. A systembased on this paradigm, for I DDQ measurement based diagnosis of bridging faults, is reported. Experimental evaluation of the performance of the system shows it to be substantially superior to existing systems, especially for larger circuits. 1 Introduction Given a circuit and the observed faulty response of the circuit, diagnosis(or fault-location) is the process of locating physical faults which result in the faulty response. Such analysis is used to gather information to improve the fabrication process. There are different approaches for fault diagnosis which includes cause-effect analysis and effectcause analysis [3]. In cause-effect analysis, before diagnosis, simulation is used to determine the possible responses of the circuit, to a given test sequence, in the presence of the targeted faults. These responses, along with the faults which cause them, are stored in a fault dictionary. To locate faults, the ..

Year: 1995
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