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Diffraction Techniques as Efficient Tools to Probe the Structure and the Microstructure of Irradiated Materials

By David Simeone, Laurence Luneville and Gianguido Baldinozzi


International audienceThe development of techniques like spin and dip coating, physical or chemical vapor deposition during the past decades offers now the opportunity for tailoring materials with numerous interfaces like multi layers or mesoporous materials. Glancing incidence X ray diffraction as well as the X ray reflectometry now offer the opportunity to probe the microstructure and the structure of materials at different depth, varying from few nanometers to few microns[1]. In this work, we firstly discuss the opportunity to use these techniques to follow the evolution of the microstructure and the structure as a function of the damage profile for new advanced nuclear materials. In the second part of this talk, we will point out the interest of the X ray reflectometry for studying ion beam mixing and then the stability of multi layers under irradiation. We lastly point out the interest of diffraction techniques to validate large scale simulations predicting the microstructural evolution of solids under irradiation [3].References:[1] D. Simeone, G. Baldinozzi, D. Gosset, G. Zalczer, and J. F. Berar. J. Appl. Crystallography, 44 :1205-1210, 2011[2] G. Baldinozzi, G. Muller, C. Laberty-Robert, D. Gosset, D. Simeone, and C. Sanchez. J. Phys. Chem.C, 116(14) :7658-7663, 2012.[3] D. Simeone, G. Demange, L. Luneville, Phys Rev E 88(3), 032116, 2013

Topics: [PHYS.COND.CM-MS]Physics [physics]/Condensed Matter [cond-mat]/Materials Science [cond-mat.mtrl-sci], [CHIM.THEO]Chemical Sciences/Theoretical and/or physical chemistry, [CHIM.MATE]Chemical Sciences/Material chemistry
Publisher: HAL CCSD
Year: 2014
OAI identifier: oai:HAL:hal-01084306v1
Provided by: HAL-CentraleSupelec
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