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Synchrotron based reciprocal space mapping and dislocation substructure analysis

By F. Hofmann, X. Song, S. Eve, S. P. Collins and A. M. Korsunsky

Abstract

During plastic deformation of FCC materials, dislocation density does not evolve uniformly but a dislocation cell/wall structure is formed. X-ray diffraction reciprocal space mapping is used to investigate this substructure within a single grain in a large grained aluminium polycrystal. A simple disolcation cell/wall model capable of computing numerical reciprocal space maps is presented. The model qualitatively captures the experimentally observed features.The full-text of this article is not currently available in ORA, but you may be able to access the article via the publisher copy link on this record page

Topics: Engineering & allied sciences, characterisation methods, crystal structure, defects, X-ray techniques, reciprocal space map, dislocation substructure
Year: 2009
DOI identifier: 10.1016/j.matlet.2009.02.014
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