The use of cross-correlation between power supply current and output voltage dynamic responses is presented as a methodology for improved mixed current /voltage testing of analogue and mixed-signal circuits. Results obtained from simulations are presented which show that better fault coverage and a simplification of test circuitry can be obtained, when compared with the results obtained from the direct observation of the individual signals. These advantages are important factors to develop viable new design for testability and buil-in self test techniques. 1 Introduction For the manufacturers of electronics products getting a product to market earlier than the competition can lead to higher profits over the product life time. Together with a reduction in throughput time in production, manufacturers are committed to improve products quality and reliability levels. Mixed-signal circuits can be divided into two broad categories which can be identified as Register Control..
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