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Bloch wave analysis of depth dependent strain effects in high resolution electron microscopy

By P. D. Nellist, E. C. Cosgriff, P. B. Hirsch and D. J. H. Cockayne

Abstract

The full-text of this book chapter is not available in ORA, but the final publication is available at www.springerlink.com (which you may be able to access it via the publisher copy link on this record page)

Topics: Materials Sciences, bloch waves, image simulations, strain imaging
Year: 2008
DOI identifier: 10.1007/978-3-540-85156-1
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