Abstract

We are developing ion-implanted Si thermistors to be used for a neutrino mass experiment and X-ray spectroscopy. For these purposes we need high reproducibility and high sensitivity. Analysis of the collected data has been performed on the basis of the `hot-electron` model and the results will be here discussed. First results obtained with test X-ray detectors are also reported

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Archivio della ricerca - Fondazione Bruno Kessler

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oai:cris.fbk.eu:11582/1308Last time updated on 9/3/2019

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