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Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope

By P. D. Nellist, E. C. Cosgriff, G. Behan, A. I. Kirkland, A. J. D'Alfonso, S. D. Findlay and L. J. Allen


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Topics: Materials Sciences, three-dimensional imaging, confocal microscopy, aberration correction
Year: 2008
DOI identifier: 10.1007/978-3-540-85156-1
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