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Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope

By P. D. Nellist, E. C. Cosgriff, G. Behan, A. I. Kirkland, A. J. D'Alfonso, S. D. Findlay and L. J. Allen

Abstract

The full-text of this book chapter is not available in ORA, but the final publication is available at www.springerlink.com (which you may be able to access it via the publisher copy link on this record page)

Topics: Materials Sciences, three-dimensional imaging, confocal microscopy, aberration correction
Year: 2008
DOI identifier: 10.1007/978-3-540-85156-1
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