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Data collection Siemens SMART CCD areadetector diffractometer Absorption correction: multi-scan

By Jiuqiang Liu, Zengbin Wei, Xilian Wei, Chong Zhang, Sadabs Sheldrick, T Min and T Max

Abstract

2827 reflections 211 parameters 1 restraint 0.42 0.30 0.04 mm 4642 measured reflections 2827 independent reflections 1168 reflections with I>2 (I) Rint = 0.135 H-atom parameters constrained max = 0.74 e A ˚ 3 min = 0.30 e A ˚

Year: 2010
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