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White Noise in MOS Transistors and Resistors

By Rahul Sarpeshkar, Tobias Delbruck and Carver A. Mead

Abstract

Shot noise and thermal noise have long been considered the results of two distinct mechanisms, but they aren't

Year: 1993
DOI identifier: 10.1109/101.261888
OAI identifier: oai:CiteSeerX.psu:10.1.1.212.7962
Provided by: CiteSeerX

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