White Noise in MOS Transistors and Resistors

By Rahul Sarpeshkar, Tobias Delbruck and Carver A. Mead

Shot noise and thermal noise have long been considered the results of two distinct mechanisms, but they aren't

Year: 1993

DOI identifier: 10.1109/101.261888

OAI identifier: oai:CiteSeerX.psu:10.1.1.212.7962

Provided by: CiteSeerX

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