Article thumbnail
Location of Repository

Real-Time Detection of Infrared Profile Patterns and Features Extraction 2

By Rubén Usamentiaga, Daniel F. García and Julio Molleda

Abstract

The pressing demand to improve quality of manufactured products requires the use of the latest technologies in order to enhance the control systems that adjust manufacturing parameters. Computer vision inspection and control are already standard technologies which are frequently used to improve the quality of manufactured products. Recently, du

Year: 2012
OAI identifier: oai:CiteSeerX.psu:10.1.1.211.5638
Provided by: CiteSeerX
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • http://citeseerx.ist.psu.edu/v... (external link)
  • http://intechweb.org/downloadp... (external link)
  • Suggested articles


    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.