A Remote Controlled Automated Measurement System

Abstract

Control of instrumentation systems through network PC's is increasingly important nowadays, both in the industry and in the R&D centers. This paper will present an automated measurement system used to characterise a semiconductor device. The system can be controlled by any of the PC's integrated in a LAN network using a client/server technology. The server controls the instrumentation through an IEEE-488 interface bus. Keywords - networking, automatic measurement system, distributed instrumentation. I

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