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Intelligent Instrument Streamlines dc Semiconductor Parameter Measurements, by

By Kohichi Maeda, Jin-ichi Ikemoto, Fumiro Tsuruda and Teruo Takeda Curve-tracer Mea

Abstract

surements take a quantum leap forward in accuracy and ease of use

Topics: Programmable Stimulus/Measurement Units Simplify Device Test Setups, by Susumu
Year: 1982
OAI identifier: oai:CiteSeerX.psu:10.1.1.186.3999
Provided by: CiteSeerX
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