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Carrier-envelope phase dynamics of synchronized mode-locked lasers

By R. Ell, W. Seitz, U. Morgner, T. Schibli and F. Kärtner

Abstract

The mode-combs of two lasers with synchronized repetition rate, a femtosecond Ti:sapphire- and a picosecond Nd:YVO4-laser, are characterized by measuring the carrier-envelope offset (CEO) frequencies of the lasers using a second/third harmonic interference scheme and direct interference in the overlap region, respectively. This method enables the measurement of the CEO frequency of narrow band lasers, here a picosecond Nd:YVO4 laser. Together with efficient nonlinear frequency conversion schemes, high power picosecond lasers may be used to extent optical frequency metrology from a Ti:sapphire standard to the UV and near IR spectral regions

Publisher: 'Elsevier BV'
Year: 2003
DOI identifier: 10.1016/S0030-4018(03)01362-2
OAI identifier: oai:pure.mpg.de:item_919548
Provided by: MPG.PuRe
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