Skip to main content
Article thumbnail
Location of Repository

By Omness-efficient Low Degree Tests, Short Pcpsvia, Epsilon-biased Sets and Lcs Mitcambridge Ma

Abstract

The key to these constructions is a nearly optimal randomnessefficient version of the low degree test [32]. In a similar way we give a randomness-efficient version of the BLR linearity test [13] (which is used, for instance, in locally testing the Hadamard code)

Topics: Locally Checkable C
Year: 2009
OAI identifier: oai:CiteSeerX.psu:10.1.1.135.6965
Provided by: CiteSeerX
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • http://citeseerx.ist.psu.edu/v... (external link)
  • http://www.cs.technion.ac.il/~... (external link)
  • Suggested articles


    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.