analog-to-digital converter (ADC) using a passive capacitor erroraveraging technique and a nested CMOS gain-boosting technique is described. The converter is optimized for low-voltage low-power applications by applying an optimum stage-scaling algorithm at the architectural level and an opamp and comparator sharing technique at the circuit level. Prototyped in a 0.18- m 6M-1P CMOS process, this converter achieves a peak signal-to-noise plus distortion ratio (SNDR) of 75.5 dB and a 103-dB spurious-free dynamic range (SFDR) without trimming, calibration, or dithering. With a 1-MHz analog input, the maximum differential nonlinearity is 0.47 LSB and the maximum integral nonlinearity is 0.54 LSB. The large analog bandwidth of the front-end sample-and-hold circuit is achieved using bootstrapped thin-oxide transistors as switches, resulting in an SFDR of 97 dB when a 40-MHz full-scale input is digitized. The ADC occupies an active area of 10 mmP and dissipates 98 mW. Index Terms—Analog integrated circuits, capacitor mismatch, comparator sharing, discrete-time common-mode voltage regulation, early comparison, low power, low voltage, nested CMOS gain boosting, opamp sharing, passive capacitor error-averaging, pipeline analog-to-digital converter, pseudo-differential, subsampling. I
To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.