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Industrial ultrasonic imaging and microscopy

By R S Gilmore

Abstract

Ultrasonic imaging and scanned acoustic microscopy are terms used to describe similar imaging processes at different magnifications and frequencies. Both processes form images by acquiring spatially correlated measurements of the interaction of high-frequency sound waves with materials. With the exception of the interference measurement, called V (z), and the gigahertz frequencies used by the higher frequency scanning acoustic microscopes, it is difficult to establish operational differences between them. This is especially true since almost all commercial ultrasonic imaging systems use transducers producing focused beams and can display magnified high-resolution images. Ultrasonic C-scan imaging was developed largely by the ultrasonic nondestructive testing industry. The development was gradual and evolutionary. Over a 50-year period, better and better broadband transducers, electronics and scanners were developed for operation at progressively higher frequencies, now ranging from 1.0 to 100 MHz. Conversely, scanning acoustic microscopes made a relatively sudden appearance 20 years ago on the campus of Stanford University

Year: 1996
OAI identifier: oai:CiteSeerX.psu:10.1.1.134.6238
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