ABSTRACT a yield–soil–topography analysis. Spectral analysis was Quantifying the spatial variability of crop yields and yield-affecting utilized by Timlin et al. (1998) to study the influence of factors are important issues in precision agriculture. Topography is topographic location and surface curvature on corn frequently one of the most important factors affecting yields, and grain yield based on data from 140 plots and five trantopographical data are much easier to obtain than time and labor- sects. Eghball et al. (1997) used fractal theory to characconsuming measurements of soil properties. In this study, yield variability and the relationships between yields and terrain slopes were analyzed using theories of multifractal and joint multifractal measures. Corn (Zea mays L.) and soybean [Glycine max (L.) Merr.] yield data from 1994 to 1998 were collected via yield monitors from a central 6.6 ha section of an agricultural field in eastern Indiana. Slopes were derived from a field terrain map using a GIS. Multifractal analysis of yield and slope maps revealed that both yield and slope distributions terize the spatial and temporal variability in corn grain yield as affected by N treatments. Fractal analysis wa
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