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High-throughput powder diffraction. I. A new approach to qualitative and quantitative powder diffraction pattern analysis using full pattern profiles

By Christopher J. Gilmore, Gordon Barr and Jonathan Paisley
Publisher: International Union of Crystallography (IUCr)
Year: 2004
DOI identifier: 10.1107/s002188980400038x
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Provided by: MUCC (Crossref)

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