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Wave function-dependent mobility and suppression of interface roughness scattering in a strained SiGe p-channel field-effect structure

By M. A. Sadeghzadeh, A. I. Horrell, O. A. Mironov, E. H. C. Parker, T. E. Whall and M. J. Kearney
Publisher: AIP Publishing
Year: 2002
DOI identifier: 10.1063/1.126410
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Provided by: MUCC (Crossref)

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