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Sequential Element Design With Built-In Soft Error Resilience

By Ming Zhang, Subhasish Mitra, T. M. Mak, Norbert Seifert, Nicholas J. Wang, Quan Shi, Kee Sup Kim, Naresh R. Shanbhag and Sanjay J. Patel
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
DOI identifier: 10.1109/TVLSI.2006.887832
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Provided by: Crossref
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