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A simplified formulation for calculation of minority-carrier effective lifetime

By Xiao-Xia Li and Ji-Huan He

Abstract

An improved simple equation to calculate the minority-carrier effective lifetime in photoconductance measurements is proposed by the perturbation method. When the given constraints are satisfied, the given formulation leads to a fast and accurate determination of effective lifetime from the bulk lifetime, surface recombination velocity, the thickness of the wafer, and diffusion coefficient. Keywords: Photoconductance, Lifetime, Recombination, Perturbation metho

Topics: Physics, QC1-999
Publisher: Elsevier
Year: 2018
DOI identifier: 10.1016/j.rinp.2018.10.008
OAI identifier: oai:doaj.org/article:4a00f48c88e94b11aa23fe6bd1796a61
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