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Accuracy of nonoscillating one-port noise measurements

By José Miguel Miranda Pantoja and José Luis Sebastián Franco


This paper presents a detailed analysis of the accuracy of nonoscillating one-port device noise measurements. A new expression is given for the calculation of the noise temperature from parameters that can be measured directly by using either a power sensor or a noise meter with the capability of making power measurements. A general expression for the DUT noise temperature error function is also obtained, which enables the authors to study how the noise measurement accuracy is affected by a number of different factors. This expression has been found very useful in order to study how the accuracy can be improved in a given noise measurement system. The error function has been applied to evaluate the uncertainty of Schottky barrier device noise measurements

Topics: Electricidad, Electrónica
Publisher: IEEE-Inst Electrical Electronics Engineers Inc
Year: 1995
DOI identifier: 10.1109/19.392870
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Provided by: EPrints Complutense
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