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Development and performance-testing of Multi-Path I/O algorithms on V-Series systems

By Ryan (Ryan T.) TerBush


As data growth continues to accelerate, so must performance and efficiency of large scale storage systems. This project will present the implementation and performance analysis of Multi-Path I/O within Data ONTAP. The goal of this feature is to take advantage of redundant paths that were previously utilized only in failure situations. The paper will address the core mechanisms that comprise the MPIO handling within the system. Furthermore it will present the difficulties of testing such a feature in a shared lab environment. The initial expectation that MPIO would provide a small performance gain, in addition to better failure handling properties, was affirmed in the results. Under heavy I/O loads, MPIO systems showed an average of 5% throughput improvement over the older single-path Ryan TerBush.Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2013.Cataloged from PDF version of thesis.Includes bibliographical references (page 52)

Topics: Electrical Engineering and Computer Science.
Publisher: Massachusetts Institute of Technology
Year: 2013
OAI identifier:
Provided by: DSpace@MIT

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