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Determination of the Residual Stress Field around Scratches Using Synchrotron X-Rays and Nanoindentation

By M.K. Khan, Michael E. Fitzpatrick, L.E. Edwards and Sarah V. Hainsworth

Abstract

This paper was published as Materials Science Forum, 2010, 652, pp. 25-30. It is available from http://www.scientific.net/MSF.652.25. Doi: 10.4028/www.scientificnet/MSF.652.25Metadata only entryThe residual strain field around the scratches of 125µm depth and 5µm root radius have been measured from the Synchrotron X-ray diffraction. Scratches were produced using different tools in fine-grained aluminium alloy AA 5091. Residual stresses up to +1700 micro-strains were measured at the scratch tip for one tool but remained up to only +1000 micro-strains for the other tool scratch. The load-displacement curves obtained from nanoindentation were used to determine the residual stresses around the scratches. It was found that the load-displacement curves are sensitive to any local residual stress field present and behave according to the type of residual stresses. This combination of nanoindentation and synchrotron X-rays has been proved highly effective for the study of small-scale residual stresses around the features such as scratches

Publisher: Trans Tech Publications
Year: 2010
DOI identifier: 10.4028/www.scientific.net
OAI identifier: oai:lra.le.ac.uk:2381/9087
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