Article thumbnail

Characterization of HfO2/TiOx ReRAM Cells in Pulse Operation Mode

By A. Hardtdegen, F. Cuppers, Moritz Alexander von Witzleben, Ulrich Böttger, S. Menzel, Rainer Waser and S. Hoffmann-Eifert
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Year: 2018
DOI identifier: 10.1109/NANO.2018.8626314
OAI identifier:
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • https://publications.rwth-aach... (external link)
  • https://publications.rwth-aach... (external link)
  • Suggested articles

    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.