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Characterization of HfO2/TiOx ReRAM Cells in Pulse Operation Mode

By A. Hardtdegen, F. Cuppers, Moritz Alexander von Witzleben, Ulrich Böttger, S. Menzel, Rainer Waser and S. Hoffmann-Eifert
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Year: 2018
DOI identifier: 10.1109/NANO.2018.8626314
OAI identifier: oai:publications.rwth-aachen.de:756181
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