Article thumbnail
Location of Repository

High-isolation Stacked RF Switch using dc-lift and Feedforward Cancellation Techniques in Standard 65 nm CMOS

By Muh-Dey Wei and Renato Negra
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Year: 2018
DOI identifier: 10.1109/ISCAS.2018.8351259
OAI identifier:
Download PDF:
Sorry, we are unable to provide the full text but you may find it at the following location(s):
  • https://publications.rwth-aach... (external link)
  • https://publications.rwth-aach... (external link)
  • Suggested articles

    To submit an update or takedown request for this paper, please submit an Update/Correction/Removal Request.