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High-isolation Stacked RF Switch using dc-lift and Feedforward Cancellation Techniques in Standard 65 nm CMOS

By Muh-Dey Wei and Renato Negra
Publisher: 'Institute of Electrical and Electronics Engineers (IEEE)'
Year: 2018
DOI identifier: 10.1109/ISCAS.2018.8351259
OAI identifier: oai:publications.rwth-aachen.de:751870
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